Search results for "photoelectron diffraction"

showing 3 items of 3 documents

Defects at the TiO2(100) surface probed by resonant photoelectron diffraction.

2006

We report photoelectron diffraction (PED) experiments of weakly sub-stoichiometric TiO 2 (100) rutile surfaces. Apart from standard core-level PED from the Ti-2p3/2 line, we have studied valence band PED from the defect induced Ti-3d states in the insulating band gap. For maximum yield, the latter were resonantly excited at the Ti-2p absorption edge. The PED patterns have been analyzed within the forward scattering approximation as well as by comparison with simulated PED patterns obtained in multiple scattering calculations. The analysis shows that the defect induced Ti-3d charge is mainly located on the second layer Ti atoms. © 2007 Elsevier B.V. All rights reserved.

DiffractionMaterials scienceScatteringForward scatterBand gapAnalytical chemistry02 engineering and technologySurfaces and Interfaces021001 nanoscience & nanotechnologyCondensed Matter Physics01 natural sciencesMolecular physicsPhotoelectron diffractionResonant photoemissionSurfaces Coatings and FilmsAbsorption edgeRutileExcited state0103 physical sciencesMaterials ChemistryTitanium dioxide010306 general physics0210 nano-technologySurface defectsLine (formation)
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Time-of-flight photoelectron momentum microscopy with 80–500 MHz photon sources: electron-optical pulse picker or bandpass pre-filter

2021

Journal of synchrotron radiation 28(6), 1891 - 1908 (2021). doi:10.1107/S1600577521010511

Nuclear and High Energy PhysicsSpectrum analyzerMaterials sciencePhotonMicroscopephotoelectron diffraction550Synchrotron radiationmomentum microscopylaw.inventionOpticslawddc:550Pulse waveTime domaintime of flight spectroscopy ; momentum microscopy ; ARPES ; photoelectron diffraction ; pulse pickingpulse pickingInstrumentationMomentum (technical analysis)Radiationbusiness.industryARPESResearch PapersTime of flighttime-of-flight spectroscopyPhysics::Accelerator Physicsbusiness
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Progress in HAXPES performance combining full-field k-imaging with time-of-flight recording

2019

Journal of synchrotron radiation 26(6), 1996-2012 (2019). doi:10.1107/S1600577519012773

time-of-flight microscopeDiffractionNuclear and High Energy PhysicsMaterials scienceMicroscopePhoton550530 Physics02 engineering and technologyKinetic energy01 natural scienceslaw.inventionOpticslaw0103 physical sciencesddc:550HAXPES010306 general physicsInstrumentationMonochromatorRadiationk-spacebusiness.industry021001 nanoscience & nanotechnology530 PhysikResearch PapersBrillouin zoneWavelengthTime of flightBrillouin zone0210 nano-technologybusinessX-ray photoelectron diffraction
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